Zero Defects in Manufacturing: A Deep Dive into Advanced AOI Solutions with Aaron Shelton from WIT
Join Philip Stoten as he talks to Aaron Shelton from WIT, a pioneering Japanese company, to uncover the secrets behind their inspection solutions. Aaron explains how their technology serves as a critical verification tool for Automated Optical Inspection (AOI) systems, enabling operators to make more accurate judgments and significantly reducing the risk of defects escaping. Discover how their system enhances the entire AOI process by integrating live camera images, fostering continuous improvement, and driving quality excellence.
As Asian companies increasingly establish operations in Mexico, the market presents unique growth opportunities and challenges. Aaron highlights the crucial role of their local partner, Quiptech, in expanding WIT’s footprint and providing indispensable customer support. With an extensive network of representatives, Quiptech ensures that WIT can deliver high-quality solutions tailored to the specific needs and mindsets of Mexican customers. Tune in for an important discussion on the importance of local partnerships and how they contribute to successful market adoptation and customer satisfaction.
Like every episode of EMS@C-Level, this one was sponsored by global inspection leader Koh Young (https://www.kohyoung.com) and Adaptable Automation Specialist Launchpad.build (https://launchpad.build).
