iNEMI Call-for-Participation Webinar Extended Reliability Assessment for Electronics Components Project
August 2 & 3, 2021
Extended reliability assessment can be used to identify and select products to be refurbished or re-assembled for longer use, helping companies reduce their consumption of raw materials, processes and waste. However, there is limited data (e.g., increased lifetime of used parts, qualification process for extended use) and a lack of standard processes to assess extended reliability of electronic components.
iNEMI’s new Extended Reliability Assessment for Electronic Components project will collect data on select components and develop a standardized procedure for extended reliability assessment and component classification. This initial phase (Phase 1) will define a methodology for assessing the extended reliability for new/unused existing electronic components identified by the team. Testing is planned for Phase 2. Juan Dominquez (Intel) will chair the project.
Two sessions are scheduled and are open and free to industry; advance registration is required. Click on one of the links below to register. If you have any questions, please contact Mark Schaffer (firstname.lastname@example.org).
Session 1 (Americas & EMEA)
August 2, 2021
11:00 a.m. — 12:00 p.m. EDT (Americas)
5:00-6:00 p.m. CEST (Europe)
Session 2 (APAC)
August 3, 2021
9:00-10:00 a.m. CST (China)
9:00-10:00 p.m. EDT on August 2 (Americas)